Internal Parameter Control

Driver Maturity

Production

Recommended for normal production use.

Caution

Compatibility Note: This information is a general guide and may be incomplete, may not match a specific project implementation, and is subject to change as supported products and versions evolve. Confirm the exact implementation and requirements for each project with Riedel and the relevant equipment vendor, then validate the required functions end to end in the target environment before deployment.

Minimum hi Version: v2.7.6

Overview

Internal Parameter Control provides locally generated sample Parameters for demonstrating Parameter Control workflows. Use its sample values to configure and exercise Parameter Widgets, Rules, and other Parameter-based controls without connecting an external device.

Information

These Parameters are demonstration data. They do not represent measurements or settings from an external device. Optional emulation changes the sample values automatically.

Supported Features

Feature	Access	Exposed Operation and Scope
Sample Parameter Read	Read-only	Read locally generated Boolean, numeric, text, and enumeration values.
Sample Parameter Write	Write-only action	Change writable sample values; no external device is changed.
Value Emulation	hi-side configuration	Change the sample values automatically to demonstrate value updates. Settings: Count of test devices (default `5`), Count of test data per device (default `100`), and Emulation time (default `3` seconds).

Known Limitations

Only the sample Parameters provided by this Node are available through this integration.

What's Not Supported

Reading or changing an external device's Parameters.
Administering hi server or Cluster settings through the sample Parameter tree.